Symmetrized-strategy failure probabilities and test bounds #
Failure-probability surrogates and basic low-individual-degree test bounds for the split strategy interface.
Symmetrized strategies and tested-branch bounds #
Trace-based failure surrogate for the axis-parallel lines test. Point answers on the left register, line answers (evaluated at the base point) on the right register of the bipartite state.
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Trace-based failure surrogate for the self-consistency test.
Uses bipartite SSC defect (cross-register overlap).
For projective measurements this equals bipartiteConsError
between the same measurement on both registers.
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Trace-based failure surrogate for the diagonal lines test.
Averages over the restriction index j ∈ {0, …, m − 1}, then
over the j-restricted diagonal test. For each j, direction
vectors have the last m − j − 1 coordinates equal to zero.
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The paper's notion of an (ε,δ,γ)-good symmetric strategy.
Matches the paper's Definition 3.1: three test-passing bounds with no
extra hypotheses. The reparametrization covariance that was formerly
listed here is now a structural property of SymStrat, where it
belongs (the paper treats diagonal measurements as geometrically
covariant by construction).
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The diagonal-line failure surrogate is nonnegative.
A good symmetric strategy has a nonnegative axis-parallel error parameter
ε.
A good symmetric strategy has a nonnegative self-consistency error
parameter δ.
A good symmetric strategy has a nonnegative diagonal-lines error parameter
γ.
Answer-valued symmetric strategies #
The answer-valued diagonal-line failure surrogate is nonnegative.
A good answer-valued symmetric strategy has a nonnegative axis-parallel
error parameter ε.
A good answer-valued symmetric strategy has a nonnegative self-consistency
error parameter δ.
A good answer-valued symmetric strategy has a nonnegative diagonal-lines
error parameter γ.